| 000 | 01115nam a2200277zi 4500 | ||
|---|---|---|---|
| 005 | 20230201161145.0 | ||
| 008 | 040830n1990eng0 13 | ||
| 020 | _a1558990720 | ||
| 035 | _aMX001000534370 | ||
| 050 |
_aTA417.23 _bH54 |
||
| 245 | 0 | 0 |
_aHigh resolution electron microscopy of defects in materials : _bSymposium held april 16-18, 1990, san francisco, california, u.s.a. / _cEd. Robert Sinclair, David j. Smith, ulrich dahmen |
| 300 | _aXi, 391 páginas | ||
| 490 | 0 |
_aMaterials Research Society symposium proceedings ; _vv. 183 |
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| 650 |
_aMateriales _xMicroscopia _vCongresos |
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| 650 |
_aMateriales _xDefectos _vCongresos |
||
| 650 |
_aMicroscopía electrónica _vCongresos |
||
| 700 |
_aSinclair, Robert _eeditor |
||
| 700 |
_aSmith, David J. _d1948- _eeditor |
||
| 700 |
_aDahmen, Ulrich _eeditor |
||
| 830 | 0 |
_aMaterials Research Society symposium proceedings _x0272-9172 |
|
| 264 | 1 |
_aPittsburgh, pennsylvania : _bMaterials research society, _cc1990 |
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| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c973 _d973 |
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