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_aSchroder, Dieter K., _eautor |
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_aSemiconductor material and device characterization / _cDieter K. Schroder |
| 250 | _a3rd ed. | ||
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_axv, 779 páginas : _bilustraciones |
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| 500 | _a"Wiley-Interscience." | ||
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_aSemiconductores _xPruebas |
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_a[Piscataway, New Jersey] : _bIEEE ; _aHoboken, New Jersey : _bWiley, _cc2006 |
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_atexto _2rdacontent |
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_asin medio _2rdamedia |
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