000 | 01127nam a2200241zi 4500 | ||
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005 | 20230201161138.0 | ||
008 | 970106s1980 xxu 000 0 eng | ||
020 | _a0306406284 | ||
035 | _aMX001000307987 | ||
050 | 0 |
_aQD921 _bN37 1979 |
|
111 | 2 |
_aNato Advanced Study Institute On Characterization Of Crystal Growth Defects By Xray Methods _d(1979 : _cDurham, England) |
|
245 | 1 | 0 |
_aCharacterization of crystal growth defects by x-ray methods : _bproceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] _cedited by Brian K. Tanner and D. Keith Bowen. |
300 | _a589 páginas | ||
490 | 0 |
_aNATO advanced study institutes series. Series B, Physics ; _v63 |
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650 | 0 |
_aCristales _xDefectos _vCongresos |
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650 | 0 |
_aCristalografĂa por rayos X _vCongresos |
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700 | 1 |
_aTanner, B. K. _q(Brian Keith) |
|
264 | 1 |
_aNew York : _bPlenum Press, _cc1980 |
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336 |
_atexto _2rdacontent |
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337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
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999 |
_c300 _d300 |