000 01127nam a2200241zi 4500
005 20230201161138.0
008 970106s1980 xxu 000 0 eng
020 _a0306406284
035 _aMX001000307987
050 0 _aQD921
_bN37 1979
111 2 _aNato Advanced Study Institute On Characterization Of Crystal Growth Defects By Xray Methods
_d(1979 :
_cDurham, England)
245 1 0 _aCharacterization of crystal growth defects by x-ray methods :
_bproceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]
_cedited by Brian K. Tanner and D. Keith Bowen.
300 _a589 páginas
490 0 _aNATO advanced study institutes series. Series B, Physics ;
_v63
650 0 _aCristales
_xDefectos
_vCongresos
650 0 _aCristalografĂ­a por rayos X
_vCongresos
700 1 _aTanner, B. K.
_q(Brian Keith)
264 1 _aNew York :
_bPlenum Press,
_cc1980
336 _atexto
_2rdacontent
337 _asin medio
_2rdamedia
338 _avolumen
_2rdacarrier
999 _c300
_d300