| 000 | 00725nam a2200217zi 4500 | ||
|---|---|---|---|
| 005 | 20230201161207.0 | ||
| 008 | 060620s2005 xxua b 001 0 eng | ||
| 020 | _a0387258000 | ||
| 035 | _aMX001001069392 | ||
| 040 |
_aOHX _bspa _cOHX _dUAB _dIXA _dDLC _dUNAMX |
||
| 050 | 0 |
_aQH212.E4 _bE44 |
|
| 100 | 1 |
_aEgerton, R. F., _eautor |
|
| 245 | 1 | 0 |
_aPhysical principles of electron microscopy : _ban introduction to TEM, SEM, and AEM / _cRay F. Egerton |
| 300 |
_axii, 202 páginas : _bilustraciones |
||
| 650 | 0 | _aMicroscopía electrónica | |
| 264 | 1 |
_aNew York : _bSpringer Verlag, _cc2005 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c2999 _d2999 |
||