| 000 | 01044nam a2200241zi 4500 | ||
|---|---|---|---|
| 005 | 20230201161138.0 | ||
| 008 | 040920 a 000 0 eng | ||
| 020 | _a3540098437 | ||
| 035 | _aMX001000296238 | ||
| 050 | 4 |
_aQD96.M3 _bI57 |
|
| 111 | 2 |
_aInternational Conference On Secondary Ion Mass Spectrometry _n(2 : _d1979 : _cStanford University) |
|
| 245 | 1 | 0 |
_aSecondary ion mass spectrometry SIMS-II : _bProceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA august 27-31, 1979 / _ceditors, A. Benninghoven ... [y otros.] |
| 300 | _a298 páginas | ||
| 490 | 0 |
_aSpringer series in chemical physics ; _vv. 9 |
|
| 650 | 0 |
_aEspectrometría de masas _vCongresos |
|
| 700 | 1 |
_aBenninghoven, A., _eeditor |
|
| 830 |
_aSpringer series in chemical physics _x 0172-6218 |
||
| 264 | 1 |
_aBerlin : _bSpringer Verlag, _c1979 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c281 _d281 |
||