| 000 | 01006nam a2200265zi 4500 | ||
|---|---|---|---|
| 005 | 20230201161138.0 | ||
| 008 | 030211c1978 enka 000 0 eng | ||
| 020 | _a0306357283 | ||
| 035 | _aMX001000287720 | ||
| 050 | 0 |
_aQC702.7B65 _bN38 1976 |
|
| 111 | 2 |
_aNato Advanced Study Institute on Material Characterization Using Ion Beams _d(1976 : _cAleria, Francia) |
|
| 245 | 1 | 0 |
_aMaterial characterization using ion beams / _cedited by J. P. Thomas and A. Cachard |
| 300 |
_axviii, 517 páginas : _bilustraciones |
||
| 490 | 0 |
_aNATO advanced study institutes series. Series B, Physics ; _v28 |
|
| 650 | 0 |
_aBombardeo iónico _vCongresos |
|
| 650 | 0 |
_aMateriales _xAnálisis _vCongresos |
|
| 650 | 0 |
_aFísica del estado sólido _vCongresos |
|
| 700 | 1 |
_aThomas, Jean-Paul, _d1944- , _eeditor |
|
| 700 | 1 |
_aCachard, A., _eeditor |
|
| 264 | 1 |
_aLondon : _bPlenum, _cc1978 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c246 _d246 |
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