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| 003 | $$aDLC | ||
| 005 | 20230201161200.0 | ||
| 008 | 001019s1996 waua b 001 0 eng | ||
| 020 | _a0819423475 (papel alcalino) | ||
| 035 | _aMX001000861652 | ||
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_aTA418.7 _bS45 1996 |
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_aSelected papers on optical methods in surface metrology / _cDavid J. Whitehouse, ed. |
| 246 | 3 | 0 | _aOptical methods in surface metrology |
| 300 |
_axxi, 638 páginas : _bilustraciones ; |
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| 490 | 0 |
_aSPIE milestone series ; _vv. MS 129 |
|
| 504 | _aIncluye referencias bibliograficas e indice | ||
| 650 | 0 |
_aSuperficies (Tecnología) _xMedición |
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| 650 | 0 | _aMedidas ópticas | |
| 700 |
_aWhitehouse, David J., _eeditor |
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| 264 | 1 |
_aBellingham, Washington : _bSPIE Optical Engineering, _cc1996 |
|
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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_c2370 _d2370 |
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