| 000 | 01107nam a2200313zi 4500 | ||
|---|---|---|---|
| 003 | $$aDLC | ||
| 005 | 20230201161159.0 | ||
| 008 | 000519s1998 nyua b 001 0 eng | ||
| 020 | _a0306458969 | ||
| 035 | _aMX001000840969 | ||
| 040 |
_aDLC _cDLC _dDLC |
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| 041 | _aENG | ||
| 050 | 4 |
_aTA418.7 _bB43 |
|
| 082 | 0 | 0 |
_a620/.44 _221 |
| 245 | 0 | 0 |
_aBeam effects, surface topography, and depth profiling in surface analysis / _cedited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell |
| 300 |
_axix, 430 páginas : _bilustraciones ; |
||
| 490 | 0 |
_aMethods of surface characterization ; _vv. 5 |
|
| 504 | _aIncluye referencias bibliograficas e indice | ||
| 650 | 0 |
_aSuperficies (Tecnología) _xAnálisis |
|
| 650 | 0 |
_aMateriales _xEfectos de la radiación |
|
| 700 | 1 |
_aCzanderna, Alvin Warren, _d1930- , _eeditor |
|
| 700 | 1 |
_aMadey, Theodore E., _eeditor |
|
| 700 | 1 |
_aPowell, Cedric John, _eeditor |
|
| 264 | 1 |
_aNew York : _bPlenum Press, _cc1998 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c2259 _d2259 |
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