000 01100nam a2200325zi 4500
003 $$aDLC
005 20230201161157.0
008 980923s1996 nyu 101 0 eng
020 _a1563965038
035 _aMX001000802928
040 _aDLC
_cDLC
041 _aENG
050 0 0 _aTK7871.85
_bS455
082 0 0 _a621.3815/2
_220
245 0 0 _aSemiconductor characterization :
_bpresent status and future needs /
_ceditors, W.M. Bullis, D.G. Seiler, A.C. Diebold
263 _a9610
300 _av, 729 páginas :
_bilustraciones
500 _aIncluye indices
650 0 _aSemiconductores
_xCaracterizacion
_vCongresos
650 0 _aSemiconductores
_xDiseño y construccion
_vCongresos
700 1 _aBullis, W. Murray,
_d1930- ,
_eeditor
700 1 _aSeiler, David G.,
_eeditor
700 1 _aDiebold, A. C.
_q(Alain C.),
_eeditor
710 2 _aAmerican Institute of Physics
264 1 _aWoodbury, New York :
_bAmerican Institute of Physics,
_c1996
336 _atexto
_2rdacontent
337 _asin medio
_2rdamedia
338 _avolumen
_2rdacarrier
999 _c2128
_d2128