000 | 01100nam a2200325zi 4500 | ||
---|---|---|---|
003 | $$aDLC | ||
005 | 20230201161157.0 | ||
008 | 980923s1996 nyu 101 0 eng | ||
020 | _a1563965038 | ||
035 | _aMX001000802928 | ||
040 |
_aDLC _cDLC |
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041 | _aENG | ||
050 | 0 | 0 |
_aTK7871.85 _bS455 |
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_a621.3815/2 _220 |
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_aSemiconductor characterization : _bpresent status and future needs / _ceditors, W.M. Bullis, D.G. Seiler, A.C. Diebold |
263 | _a9610 | ||
300 |
_av, 729 páginas : _bilustraciones |
||
500 | _aIncluye indices | ||
650 | 0 |
_aSemiconductores _xCaracterizacion _vCongresos |
|
650 | 0 |
_aSemiconductores _xDiseño y construccion _vCongresos |
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700 | 1 |
_aBullis, W. Murray, _d1930- , _eeditor |
|
700 | 1 |
_aSeiler, David G., _eeditor |
|
700 | 1 |
_aDiebold, A. C. _q(Alain C.), _eeditor |
|
710 | 2 | _aAmerican Institute of Physics | |
264 | 1 |
_aWoodbury, New York : _bAmerican Institute of Physics, _c1996 |
|
336 |
_atexto _2rdacontent |
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337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
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999 |
_c2128 _d2128 |