| 000 | 00856nam a2200217zi 4500 | ||
|---|---|---|---|
| 005 | 20230201161157.0 | ||
| 008 | 980814s1985 xxua 100 0 eng d | ||
| 035 | _aMX001000800779 | ||
| 041 | _aSPA | ||
| 050 | 4 |
_aQH212.E4 _bE54 1985 |
|
| 110 | 2 |
_aElectron Microscopy Society of America. _bMeeting _n(43 : _d1985 : _cLouisville, Kentucky) |
|
| 245 | 1 | 0 |
_aProceedings : _bForty-Third Annual Meeting : Electron Microscopy Society of America, Louisville, Kentucky, 5-9 August, 1985 / _ced. G. W. Bailey |
| 300 |
_aiii, 760 páginas : _bilustraciones |
||
| 650 | 4 |
_aMicroscopía electrónica _vCongresos |
|
| 700 | 1 |
_aBailey, George W., _s1933- , _eeditor |
|
| 264 | 1 |
_aSan Francisco, California : _bSan Francisco, _c1985 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c2093 _d2093 |
||