000 | 01161nam a2200289zi 4500 | ||
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005 | 20230201161149.0 | ||
008 | 040830s1993 000 0 eng | ||
020 | _a1558991905 | ||
035 | _aMX001000621108 | ||
050 |
_aTA418.7 _bA765 |
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245 | 0 | 0 |
_aAtomic - scale imaging of surfaces and interfaces : _bSymposium held november 30- december 2, 1992 boston, massachusetts. u.s.a. / _cEdits. David k. biegelsen, David j. Smith, s. y. tong |
300 | _a288 páginas | ||
490 | 0 |
_aMaterials Research Society symposium proceedings ; _vv. 295 |
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650 |
_aSuperficies (Tecnología) _vCongresos |
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650 | _aMicroscopios electrónicos exploradores | ||
650 |
_aEstructura atómica _vCongresos |
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700 |
_aBiegelsen, David K., _eeditor |
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700 |
_aSmith, David J. _d1948- _eeditor |
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700 |
_aTong, S. Y. _eeditor |
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710 | 2 | _aMaterials Research Society | |
830 | 0 |
_aMaterials Research Society symposium proceedings _x0272-9172 |
|
264 | 1 |
_aPittsburgh, pennsylvania : _bMaterials research society, _cc1993 |
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336 |
_atexto _2rdacontent |
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337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
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999 |
_c1342 _d1342 |