| 000 | 00768nam a2200217zi 4500 | ||
|---|---|---|---|
| 005 | 20230201161136.0 | ||
| 008 | 970106s1973 a 000 0 eng d | ||
| 035 | _aMX001000178540 | ||
| 050 |
_aQD921 _bC64 |
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| 245 | 0 | 0 |
_aComputed electron micrographs and defect indetification / _cBy a. k. head, p. humble. l. m. clarebrough... |
| 300 | _a400 páginas | ||
| 490 | 0 |
_aDefects in crystalline solids ; _v7 |
|
| 650 | 4 |
_aProcesamiento electrónico de datos _xTales _xDefectos |
|
| 650 | 4 |
_aProcesamiento electrónico de datos _xMicroscopio electronico |
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| 700 | _aHead, A. K. | ||
| 264 | 1 |
_aAmsterdam : _bNorth-holland, _c1973 |
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| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c134 _d134 |
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