000 | 00705nam a2200217zi 4500 | ||
---|---|---|---|
005 | 20230201161149.0 | ||
008 | s1993 cipa eng0 09 | ||
020 | _a0138137595 | ||
035 | _aMX001000612224 | ||
050 |
_aQH212.S3 _bL44 |
||
100 | 0 |
_aLee, Robert Edward, _eautor |
|
245 | 1 | 0 |
_aScanning electron microscopy and x-ray microanalysis / _cRobert Edward Lee |
300 | _a458 páginas | ||
650 | _aMicroanalisis electronico explorador | ||
650 | _aMicroanálisis por rayos X | ||
264 | 1 |
_aEnglewood cliffs, new jersey : _bPtr prentice hall, _c1993 |
|
336 |
_atexto _2rdacontent |
||
337 |
_asin medio _2rdamedia |
||
338 |
_avolumen _2rdacarrier |
||
999 |
_c1311 _d1311 |