000 00705nam a2200217zi 4500
005 20230201161149.0
008 s1993 cipa eng0 09
020 _a0138137595
035 _aMX001000612224
050 _aQH212.S3
_bL44
100 0 _aLee, Robert Edward,
_eautor
245 1 0 _aScanning electron microscopy and x-ray microanalysis /
_cRobert Edward Lee
300 _a458 páginas
650 _aMicroanalisis electronico explorador
650 _aMicroanálisis por rayos X
264 1 _aEnglewood cliffs, new jersey :
_bPtr prentice hall,
_c1993
336 _atexto
_2rdacontent
337 _asin medio
_2rdamedia
338 _avolumen
_2rdacarrier
999 _c1311
_d1311