| 000 | 00716nam a2200217zi 4500 | ||
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| 005 | 20230201161148.0 | ||
| 008 | 050201cipa eng0 09 | ||
| 020 | _a0815512007 | ||
| 035 | _aMX001000607732 | ||
| 050 |
_aQC611.45 _bC42 |
||
| 245 | 0 | 0 |
_aCharacterization of semiconductor materials : _bPrinciples and methods / _cEd. by gary e. mcguire |
| 300 | _a330 páginas | ||
| 490 | 0 | _aMaterials science and process technology series | |
| 650 |
_aSemiconductores _vManuales |
||
| 700 | 1 |
_aMcGuire, G. E., _eeditor |
|
| 264 | 1 |
_aPark ridge, new jersey : _bNoyes, _c1989 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c1287 _d1287 |
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