| 000 | 01115nam a2200277zi 4500 | ||
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| 008 | 040830l1989eng0 13 | ||
| 020 | _a1558990127 | ||
| 035 | _aMX001000575405 | ||
| 050 |
_aTA417.23 _bH54 1988 |
||
| 245 | 0 | 0 |
_aHigh resolution microscopy of materials : _bSysmposium held november 29-december 1, 1988, boston, massachusetts, u. s. a. / _cEds. William krakow, Fernando a. Ponce, David j. Smith |
| 300 | _a396 páginas | ||
| 490 | 0 |
_aMaterials Research Society symposium proceedings ; _vv. 139 |
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| 650 |
_aMateriales _xMicroscopia _vCongresos |
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| 650 |
_aMateriales _xDefectos _vCongresos |
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| 650 |
_aMicroscopía electrónica _vCongresos |
||
| 700 |
_aKrakow, William _eeditor |
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| 700 |
_aPonce, Fernando A. _eeditor |
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| 700 |
_aSmith, David J. _d1948- _eeditor |
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| 830 | 0 |
_aMaterials Research Society symposium proceedings _x0272-9172 |
|
| 264 | 1 |
_aPittsburgh, pennsylvania : _bMaterials research society, _cc1989 |
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| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c1150 _d1150 |
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