| 000 | 00836nam a2200241zi 4500 | ||
|---|---|---|---|
| 005 | 20230201161147.0 | ||
| 008 | c 1979cipa eng0 11 | ||
| 020 | _a0471519456 | ||
| 035 | _aMX001000567792 | ||
| 050 |
_aQD96.S43 _bW55 |
||
| 100 | 0 |
_aWilson, Robert G., _eautor |
|
| 245 | 1 | 0 |
_aSecondary ion mass spectrometry : _bA practical handbook for dept profiling and bulk impurity analysis / _cR. g. Wilson, f. a. stevie, c. w. magee |
| 300 | _a32 páginas | ||
| 500 | _a"a wiley-interscience publication" | ||
| 650 | _aEspectrometría de masas de iones secundarios | ||
| 700 |
_aSteve, F. A. _eautor |
||
| 700 |
_aMagee, C. W., _eautor |
||
| 264 | 1 |
_aNew York : _bJ. Wiley, _cc1979 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c1113 _d1113 |
||