TY  - BOOK
AU  - Sinclair, Robert
AU  - Smith, David J.
AU  - Dahmen, Ulrich
TI  - High resolution electron microscopy of defects in materials: Symposium held april 16-18, 1990, san francisco, california, u.s.a. 
T2  - Materials Research Society symposium proceedings
SN  - 1558990720
AV  - TA417.23 H54
PY  - 1990///
CY  - Pittsburgh, pennsylvania
PB  - Materials research society
KW  - Materiales
KW  - Microscopia
KW  - Congresos
KW  - Defectos
KW  - Microscopía electrónica
ER  -