High resolution electron microscopy of defects in materials :  Symposium held april 16-18, 1990, san francisco, california, u.s.a. / 
Ed. Robert Sinclair, David j. Smith, ulrich dahmen 
 - Xi, 391 páginas 
 - Materials Research Society symposium proceedings ;  v. 183 .
 - Materials Research Society symposium proceedings .
<br/><br/><label>ISBN: </label>1558990720 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materiales--Microscopia--Congresos<br/>Materiales--Defectos--Congresos<br/>Microscopía electrónica--Congresos
<br/><br/><label>LC Class. No.: </label>TA417.23  / H54