Characterization of crystal growth defects by x-ray methods :  proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] 
edited by Brian K. Tanner and D. Keith Bowen. 
 - 589 páginas 
 - NATO advanced study institutes series. Series B, Physics ;  63 .
<br/><br/><label>ISBN: </label>0306406284 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Cristales--Defectos--Congresos<br/>Cristalografía por rayos X--Congresos
<br/><br/><label>LC Class. No.: </label>QD921  / N37 1979