TY  - BOOK
AU  - Egerton,R.F.
TI  - Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM 
SN  - 0387258000
AV  - QH212.E4 E44
PY  - 2005///
CY  - New York
PB  - Springer Verlag
KW  - Microscopía electrónica
ER  -