TY  - BOOK
AU  - Benninghoven,A.
ED  - International Conference On Secondary Ion Mass Spectrometry
TI  - Secondary ion mass spectrometry SIMS-II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA august 27-31, 1979 
T2  - Springer series in chemical physics
SN  - 3540098437
AV  - QD96.M3 I57
PY  - 1979///
CY  - Berlin
PB  - Springer Verlag
KW  - Espectrometría de masas
KW  - Congresos
ER  -