Secondary ion mass spectrometry SIMS-II :  Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA august 27-31, 1979 / 
editors, A. Benninghoven ... [y otros.] 
 - 298 páginas 
 - Springer series in chemical physics ;  v. 9 .
 - Springer series in chemical physics  .
<br/><br/><label>ISBN: </label>3540098437 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Espectrometría de masas--Congresos
<br/><br/><label>LC Class. No.: </label>QD96.M3  / I57