TY  - BOOK
AU  - Bailey,George W.
ED  - Electron Microscopy Society of America.
TI  - Proceedings: Thirty-Eighth Annual Meeting : Electron Microscopy Society of America, San Francisco, California, August 4-8, 1980 
AV  - QH212.E4 E54 1980
PY  - 1980///
CY  - Baton Rouge, Louisiana
PB  - Claitor's
KW  - Microscopía electrónica
KW  - Congresos
ER  -