Proceedings, fortieth Annual Meeting :  Electron Microscopy Society of America :  Washington, D.C., August 9-13, 1982 / 
edit. G. W. Bailey 
 - 757 páginas 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopía electrónica--Congresos
<br/><br/><label>LC Class. No.: </label>QH212.E4  / E54 1982