Atomic - scale imaging of surfaces and interfaces :  Symposium held november 30- december 2, 1992 boston, massachusetts. u.s.a. / 
Edits. David k. biegelsen, David j. Smith, s. y. tong 
 - 288 páginas 
 - Materials Research Society symposium proceedings ;  v. 295 .
 - Materials Research Society symposium proceedings .
<br/><br/><label>ISBN: </label>1558991905 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Superficies (Tecnología)--Congresos<br/>Microscopios electrónicos exploradores<br/>Estructura atómica--Congresos
<br/><br/><label>LC Class. No.: </label>TA418.7  / A765