TY  - BOOK
AU  - Head, A. K.
TI  - Computed electron micrographs and defect indetification
T2  - Defects in crystalline solids
AV  - QD921 C64
PY  - 1973///
CY  - Amsterdam
PB  - North-holland
KW  - Procesamiento electrónico de datos
KW  - Tales
KW  - Defectos
KW  - Microscopio electronico
ER  -