Advances in surface and thin film diffraction :  Symposium held november 27-29, 1990, boston, massachusetts, u. s. a. / 
Eds. ting c. huang, phillip i. Cohen, David j. eaglesham 
 - xiii, 362 páginas 
 - Materials Research Society symposium proceedings ;  v. 208 .
 - Materials Research Society symposium proceedings .
<br/><br/><label>ISBN: </label>155899100x 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Peliculas delgadas--Superficies--Congresos<br/>Peliculas delgadas--Propiedades opticas--Congresos<br/>Difraccion--Congresos
<br/><br/><label>LC Class. No.: </label>QC176.84S93  / A38