Vista normal Vista MARC Vista ISBD

High resolution electron microscopy of defects in materials : Symposium held april 16-18, 1990, san francisco, california, u.s.a. / Ed. Robert Sinclair, David j. Smith, ulrich dahmen - Xi, 391 páginas - Materials Research Society symposium proceedings ; v. 183 . - Materials Research Society symposium proceedings .

ISBN: 1558990720

Subjects--Topical Terms:
Materiales--Microscopia--Congresos
Materiales--Defectos--Congresos
Microscopía electrónica--Congresos

LC Class. No.: TA417.23 / H54