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Birkholz, Mario,

Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel - xxii, 356 páginas : ilustraciones

ISBN: 3527310525 9783527310524

Subjects--Topical Terms:
Películas delgadas
Espectroscopia de rayos-X

LC Class. No.: QC176.83 / B57

Dewey Class. No.: 530.4275