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Characterization of crystal growth defects by x-ray methods : proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] edited by Brian K. Tanner and D. Keith Bowen. - 589 páginas - NATO advanced study institutes series. Series B, Physics ; 63 .

ISBN: 0306406284

Subjects--Topical Terms:
Cristales--Defectos--Congresos
Cristalografía por rayos X--Congresos

LC Class. No.: QD921 / N37 1979