Anomalous X-ray scattering for materials characterization : atomic-scale structure determination /
Waseda, Yoshio,
Anomalous X-ray scattering for materials characterization : atomic-scale structure determination / Yoshio Waseda - xiii, 214 páginas : ilustraciones - Springer tracts in modern physics, v. 179 . - Springer tracts in modern physics .
3540434437 (papel libre de acido)
Rayos X--Dispersión
QC482.S3 / W37
539 s 548/.83
Anomalous X-ray scattering for materials characterization : atomic-scale structure determination / Yoshio Waseda - xiii, 214 páginas : ilustraciones - Springer tracts in modern physics, v. 179 . - Springer tracts in modern physics .
3540434437 (papel libre de acido)
Rayos X--Dispersión
QC482.S3 / W37
539 s 548/.83